Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials

Schwarz J, Niebauer M, Kolesnik-Gray M, Szabo M, Baier L, Chava P, Erbe A, Krstic V, Rommel M, Hutzler A (2023)

Publication Language: English

Publication Type: Journal article

Publication year: 2023

Journal

Small Methods John Wiley & Sons Ltd

DOI: 10.1002/smtd.202300618

Abstract

Van der Waals materials exhibit intriguing properties for future electronic and optoelectronic devices. As those unique features strongly depend on the materials' thickness, it has to be accessed precisely for tailoring the performance of a specific device. In this study, a nondestructive and technologically easily implementable approach for accurate thickness determination of birefringent layered materials is introduced by combining optical reflectance measurements with a modular model comprising a 4×4 transfer matrix method and the optical components relevant to light microspectroscopy. This approach is demonstrated being reliable and precise for thickness determination of anisotropic materials like highly oriented pyrolytic graphite and black phosphorus in a range from atomic layers up to more than 100 nm. As a key feature, the method is well-suited even for encapsulated layers outperforming state of-the-art techniques like atomic force microscopy.

Authors with CRIS profile

Julian Schwarz Lehrstuhl für Elektronische Bauelemente Michael Niebauer Lehrstuhl für Elektronische Bauelemente Maria Kolesnik-Gray Chair of Applied Physics Vojislav Krstic Professur für Angewandte Physik Andreas Hutzler Lehrstuhl für Elektronische Bauelemente

Additional Organisation(s)

FAU Profilzentrum Licht.Materie.Quantentechnologien (FAU LMQ)

Related research project(s)

Electronic devices based on the 2D material black phosphorus - layer-dependent properties (HU 2827/2-1) Sept. 16, 2021 - Sept. 15, 2024 Physikalische Modellierung mikrospektroskopischer Messungen zur Charakterisierung von optischen Schichtsystemen May 1, 2021 - May 1, 2024

Involved external institutions

Helmholtz-Zentrum Dresden-Rossendorf (HZDR) DE Germany (DE) Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB) DE Germany (DE)

How to cite

APA:

Schwarz, J., Niebauer, M., Kolesnik-Gray, M., Szabo, M., Baier, L., Chava, P.,... Hutzler, A. (2023). Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials. Small Methods. https://doi.org/10.1002/smtd.202300618

MLA:

Schwarz, Julian, et al. "Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals Materials." Small Methods (2023).

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