Prof. Dr.-Ing. Jörg Schulze



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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Low-Temperature Characterization of Sheet and Contact Resistance in 4H-SiC Test Structures from 300 K to 4 K (2026) Hobbacher E, Magerl F, Pixius C, Förthner J, May A, Rommel M, Schulze J Conference contribution Impact of Surface Treatment on Noise in PL Measurements of Silicon Vacancies in 4H-SiC Lateral PIN-Diodes (2026) Schwarberg J, Magerl F, Beuer S, May A, Gobert C, Siebert M, Miersch C, et al. Journal article, Letter Correction: Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes (Scientific Reports, (2025), 15, 1, (39578), 10.1038/s41598-025-25338-0) (2026) Kinstler A, Neumann R, Taylor AA, Besendörfer S, Meißner E, Weingärtner R, Brunner F, et al. Journal article, Erratum Towards a Fully Integrated 4H-SiC A-Plane Quantum-Chip – Transistors and Light Emitters (2026) Schwarberg J, Dick J, May A, Michałowski P, Kallinger B, Kammel R, Rommel M, Schulze J Journal article Scalable Fabrication and Electrical Characterization of Lateral pin-Diodes on 4H-SiC a-Plane Wafers for Functionalization of Silicon Vacancies (2026) Schwarberg J, Gobert C, Hrunski F, May A, Knolle W, Kallinger B, Schmid F, et al. Journal article The Tunneling Field-Effect Transistor as Novel Device Concept for High-Frequency Hard-Switching Power Electronics (2026) Dick J, Schwarberg J, Rommel M, Schulze J Journal article Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes (2025) Kinstler A, Neumann R, Taylor AA, Besendörfer S, Meißner E, Weingärtner R, Brunner F, et al. Journal article Quantum efficiency scaling by cascaded Ge multi-stage tunnel junctions (2025) Hack M, Korner R, Schwarz D, Daus A, Schulze J, Oehme M Journal article Fabrication and Electrical Characterization of Pure Boron on 4H-SiC Junctions (2025) Wimmer J, Dick J, Schulze J Conference contribution Electroluminescent Behavior of Defects in 4H-SiC Light Emitting Diodes (2025) Ultsch S, Dick J, Schwarz J, Schulze J Conference contribution, Original article