Correction: Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes (Scientific Reports, (2025), 15, 1, (39578), 10.1038/s41598-025-25338-0)

Kinstler A, Neumann R, Taylor AA, Besendörfer S, Meißner E, Weingärtner R, Brunner F, Brusaterra E, Treidel EB, Schulze J (2026)

Publication Type: Journal article, Erratum

Publication year: 2026

Journal

Scientific Reports Nature Publishing Group: Open Access Journals - Option B

Book Volume: 16

Article Number: 15340

DOI: 10.1038/s41598-026-53284-y

Abstract

Correction to: Scientific Reportshttps://doi.org/10.1038/s41598-025-25338-0, published online 12 November 2025 The original version of this Article contained an error in Table 1 under the heading ‘Leakage Mechanism’, where the equation for “Phonon-Assisted-Tunneling (PAT)” under the heading ‘Analytical Expression’ was incorrect. The correct and incorrect values appear below. Incorrect: Correct: The original Article has been corrected.

Authors with CRIS profile

Alexander Kinstler Lehrstuhl für Elektronische Bauelemente Elke Meißner Lehrstuhl für Elektronische Bauelemente Jörg Schulze Lehrstuhl für Elektronische Bauelemente

Involved external institutions

Infineon Technologies AG DE Germany (DE) Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik (FBH) DE Germany (DE) Infineon Technologies Austria AG AT Austria (AT) Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB) DE Germany (DE)

How to cite

APA:

Kinstler, A., Neumann, R., Taylor, A.A., Besendörfer, S., Meißner, E., Weingärtner, R.,... Schulze, J. (2026). Correction: Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes (Scientific Reports, (2025), 15, 1, (39578), 10.1038/s41598-025-25338-0). Scientific Reports, 16. https://doi.org/10.1038/s41598-026-53284-y

MLA:

Kinstler, Alexander, et al. "Correction: Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes (Scientific Reports, (2025), 15, 1, (39578), 10.1038/s41598-025-25338-0)." Scientific Reports 16 (2026).

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