Materials Science in Semiconductor Processing
Journal Abbreviation: MAT SCI SEMICON PROC
ISSN: 1369-8001
Publisher: Elsevier
Publications (9)
Investigation of amorphous-SiC thin film deposition by RF magnetron sputtering for optical applications (2024)
Chaussende D, Tabouret V, Crisci A, Morais M, Coindeau S, Berthomé G, Kollmuß M, et al.
Journal article
Low-temperature performance of GeSn-on-Si avalanche photodiodes toward single-photon detection (2024)
Wanitzek M, Hack M, Schwarz D, Schulze J, Oehme M
Journal article
Utilizing direct Zener tunneling in Germanium for cryogenic quantum applications (2024)
Hack M, Seidel L, Wanitzek M, Oehme M, Schulze J, Schwarz D
Journal article
First-principles investigations of structural, electronic and thermoelectric properties of Sb/Bi2Se3 van der Waals heterostructure (2022)
Ait Tamerd M, Marjaoui A, El Kasmi A, Assebban M, Diani M, Zanouni M
Journal article
Defect reduction in SiC epilayers by different substrate cleaning methods (2022)
Baierhofer D, Thomas B, Staiger F, Marchetti B, Foerster C, Erlbacher T
Journal article
Wavelength-selective 4H-SiC UV-sensor array (2019)
Matthus CD, Bauer AJ, Frey L, Erlbacher T
Journal article, Original article
An adhesive bonding approach by hydrogen silsesquioxane for silicon carbide-based LED applications (2019)
Lin L, Ou Y, Jokubavicius V, Syväjärvi M, Liang M, Liu Z, Yi X, et al.
Journal article, Original article
From thin film to bulk 3C-SiC growth: Understanding the mechanism of defects reduction (2018)
La Via F, Severino A, Anzalone R, Bongiorno C, Litrico G, Mauceri M, Schöler M, et al.
Journal article, Original article
Improved electrical behavior of ZrO2-based MIM structures by optimizing the O3 oxidation pulse time (2015)
Paskaleva A, Weinreich W, Bauer A, Lemberger M, Frey L
Journal article, Original article