Low-temperature performance of GeSn-on-Si avalanche photodiodes toward single-photon detection

Wanitzek M, Hack M, Schwarz D, Schulze J, Oehme M (2024)

Publication Type: Journal article

Publication year: 2024

Journal

Materials Science in Semiconductor Processing Elsevier

Book Volume: 176

Article Number: 108303

DOI: 10.1016/j.mssp.2024.108303

Abstract

Avalanche photodiodes utilizing GeSn as an absorbing material can be used for low-light detection of telecommunication wavelengths, such as 1550 nm. We present the performance of GeSn-on-Si avalanche photodiodes at low-temperatures down to 110 K. It was found, that at temperatures above 190 K the dark current is dominated by generation-recombination due to trap states at the SiO2-semiconductor interface with an activation energy of ∼0.2 eV. At lower temperatures and high reverse voltages the leakage mechanism shifts to trap-assisted-tunneling. Responsivity measurements show the shift of the absorption edge toward shorter wavelengths. For 1550 nm and at 140 K a responsivity of 0.097 A/W is achieved, which is five times higher than a Ge reference-APD. When biased in the Geiger-mode, measurements of the dark count rates were performed, marking the first step towards GeSn-on-Si single-photon detectors for 1550 nm radiation.

Authors with CRIS profile

Jörg Schulze Lehrstuhl für Elektronische Bauelemente

Involved external institutions

Universität Stuttgart DE Germany (DE)

How to cite

APA:

Wanitzek, M., Hack, M., Schwarz, D., Schulze, J., & Oehme, M. (2024). Low-temperature performance of GeSn-on-Si avalanche photodiodes toward single-photon detection. Materials Science in Semiconductor Processing, 176. https://dx.doi.org/10.1016/j.mssp.2024.108303

MLA:

Wanitzek, Maurice, et al. "Low-temperature performance of GeSn-on-Si avalanche photodiodes toward single-photon detection." Materials Science in Semiconductor Processing 176 (2024).

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