Dr. Matthias Weißer

Lehrstuhl für Kristallographie und Strukturphysik

Atomic diffusion in liquid gallium and gallium-nickel alloys probed by quasielastic neutron scattering and molecular dynamic simulations (2024) Shahzad A, Yang F, Steffen J, Neiß C, Panchenko A, Götz K, Vogel C, et al. Journal article Author Correction: Isolated Rh atoms in dehydrogenation catalysis (Scientific Reports, (2023), 13, 1, (4458), 10.1038/s41598-023-31157-y) (2023) Wittkämper H, Hock R, Weißer M, Dallmann J, Vogel C, Raman N, Taccardi N, et al. Journal article, Erratum Isolated Rh atoms in dehydrogenation catalysis (2023) Wittkämper H, Hock R, Weißer M, Dallmann J, Vogel C, Raman N, Tacardi N, et al. Journal article Removing the orientational degeneracy of the TS defect in 4H-SiC by electric fields and strain (2021) Rühl M, Lehmeyer J, Nagy R, Weißer M, Bockstedte M, Krieger M, Weber HB Journal article, Letter X-ray characterization of physical-vapor-transport-grown bulk AlN single crystals (2020) Wicht T, Mueller S, Weingaertner R, Epelbaum B, Besendoerfer S, Blaess U, Weißer M, et al. Journal article Complementary Molecular Dynamics and X-ray Reflectivity Study of an Imidazolium-Based Ionic Liquid at a Neutral Sapphire Interface (2015) Brkljaca Z, Klimczak M, Milicevic Z, Weißer M, Taccardi N, Wasserscheid P, Smith DM, et al. Journal article Radial oxygen precipitation of a 12 '' CZ silicon crystal studied in-situ with high energy X-ray diffraction (2014) Bergmann C, Will J, Gröschel A, Weißer M, Magerl A Journal article Growth and nucleation regimes in boron doped silicon by dynamical x-ray diffraction (2014) Will J, Gröschel A, Bergmann C, Weißer M, Magerl A Journal article Thickness dependence of the integrated Bragg intensity for statistically disturbed silicon crystals (2011) Will J, Gröschel A, Weißer M, Magerl A Journal article Structural defects in SiC crystals investigated by high energy x-ray diffraction (2004) Weißer M, Seitz C, Wellmann P, Hock R, Magerl A Journal article, Original article