The promise of GaAs 200 in small-angle neutron scattering for higher resolution

Magerl A, Lemmel H, Appel M, Weißer M, Kretzer U, Zobel M (2024)

Publication Type: Journal article

Publication year: 2024

Journal

Journal of Applied Crystallography International Union of Crystallography

Book Volume: 57

Pages Range: 1282-1287

DOI: 10.1107/S1600576724007246

Abstract

The Q resolution in Bonse-Hart double-crystal diffractometers is determined for a given Bragg angle by the value of the crystallographic structure factor. To date, the reflections Si 220 or Si 111 have been used exclusively in neutron scattering, which provide resolutions for triple-bounce crystals of about 2×10-5Å-1 (FWHM). The Darwin width of the GaAs 200 reflection is about a factor of 10 smaller, offering the possibility of a Q resolution of 2×10-6Å-1 provided crystals of sufficient quality are available. This article reports a feasibility study with single-bounce GaAs 200, yielding a Q resolution of 4.6×10-6Å-1, six times superior in comparison with a Si 220 setup.

Authors with CRIS profile

Andreas Magerl Lehrstuhl für Biophysik Matthias Weißer Lehrstuhl für Kristallographie und Strukturphysik (ICSP)

Involved external institutions

Technische Universität Wien / Vienna University of Technology AT Austria (AT) Institute Laue-Langevin (ILL) FR France (FR) Freiberger Compound Materials GmbH DE Germany (DE) Forschungszentrum Jülich / Research Centre Jülich (FZJ) DE Germany (DE)

How to cite

APA:

Magerl, A., Lemmel, H., Appel, M., Weißer, M., Kretzer, U., & Zobel, M. (2024). The promise of GaAs 200 in small-angle neutron scattering for higher resolution. Journal of Applied Crystallography, 57, 1282-1287. https://doi.org/10.1107/S1600576724007246

MLA:

Magerl, Andreas, et al. "The promise of GaAs 200 in small-angle neutron scattering for higher resolution." Journal of Applied Crystallography 57 (2024): 1282-1287.

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