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Andrea Cattaneo
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Lehrstuhl für Technische Elektronik
Publications
(4)
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A Physically Based Reliability Modelling Framework for nm-CMOS RF Devices and Circuits undergoing RF Stress (2015)
Cattaneo A
Thesis
Impact of DC and RF non-conducting stress on nMOS reliability (2015)
Cattaneo A, Pinarello S, Müller JE, Weigel R
Conference contribution
Frequency Response of Stress-Effects on CMOS Power Amplifiers (2014)
Cattaneo A, Pinarello S, Müller JE, Weigel R
Conference contribution
MOSFET degradation under DC and RF Fowler-Nordheim stress (2014)
Cattaneo A, Pinarello S, Müller JE, Weigel R
Conference contribution