CNR Institute for Microelectronics and Microsystems (CNR-IMM)

Research facility


Location: Catania, Italy (IT) IT

ISNI: 0000000417587362

ROR: https://ror.org/05vk2g845

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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

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Abstract

Journal

From thin film to bulk 3C-SiC growth: Understanding the mechanism of defects reduction (2018) La Via F, Severino A, Anzalone R, Bongiorno C, Litrico G, Mauceri M, Schöler M, et al. Journal article, Original article Growth, defects and doping of 3C-SiC on hexagonal polytypes (2017) Yakimova R, Ivanov IG, Vines L, Linnarsson MK, Gällström A, Giannazzo F, Roccaforte F, et al. Journal article, Original article Characterization of protrusions and stacking faults in 3C-SiC grown by sublimation epitaxy using 3C-SiC-on-Si seeding layers (2017) Schöler M, Schuh P, Litrico G, La Via F, Mauceri M, Wellmann P Journal article, Original article Sublimation growth of bulk 3C-SiC using 3C-SiC-on-Si (1 0 0) seeding layers (2017) Schuh P, Schöler M, Wilhelm M, Syväjärvi M, Litrico G, La Via F, Mauceri M, Wellmann P Journal article, Original article Growing bulk-like 3C-SiC from seeding material produced by CVD (2017) Schuh P, Arzig M, Litrico G, La Via F, Mauceri M, Wellmann P Journal article, Original article Physical vapor growth of double position boundary free, quasi-bulk 3C-SiC on high quality 3C-SiC on Si CVD templates (2016) Schuh P, Vecera P, Hirsch A, Syväjärvi M, Litrico G, La Via F, Mauceri M, Wellmann P Journal article, Original article Electrical properties of the hydrogen intercalated epitaxial graphene/SiC interface investigated by nanoscale current mapping (2015) Giannazzo F, Hertel S, Albert A, Fisichella G, La Magna A, Roccaforte F, Krieger M, Weber HB Journal article, Letter
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