Professur für Kristallographie und Strukturphysik

Kinetics of the reactive crystallization of CuInSe2 and CuGaSe2 chalcopyrite films for solar cell applications (2006) Hock R Conference contribution In situ investigation of the formation of Cu(In,Ga)Se-2 from selemsed metallic precursors by X-ray diffraction - The impact of Gallium, Sodium and Selenium excess (2005) Hock R Conference contribution The build-up of strain fields in Czochralski-Si observed in real time by high energy x-ray diffraction (2005) Hock R Conference contribution [01-15] grown 6H SiC bulk crystals investigated by high energy triple axis x-ray diffraction (2005) Hock R Conference contribution A high-energy triple-axis X-ray diffractometer for the study of the structure of bulk crystals (2004) Hock R Journal article Crystallization of micelles at chemically terminated interfaces (2004) Hock R Journal article Structural defects in SiC crystals investigated by high energy x-ray diffraction (2004) Weißer M, Seitz C, Wellmann P, Hock R, Magerl A Journal article, Original article Intensity distribution of the eight-beam case of the Si-888 reflection in backscattering geometry (2004) Hock R Journal article Formation of CuInSe2 by the annealing of stacked elemental layers - analysis by in situ high-energy powder diffraction (2003) Hock R Journal article Intergrown niobian rutile phases with Sc- and W-rich ferrocolumbite: An electron-microprobe and Rietveld study (2003) Hock R Journal article