Real-time XRD investigations during the formation of Cu(IngGa)Se-2 Thin films

Hock R (2006)

Publication Status: Published

Publication Type: Conference contribution

Publication year: 2006

Journal

Particle & Particle Systems Characterization Wiley

Publisher: WILEY-V C H VERLAG GMBH

Book Volume: 22

Pages Range: 423-426

Journal Issue: 6

DOI: 10.1002/ppsc.200501003

Abstract

Knowledge of the solid-state reactions providing the synthesis of the absorber material Cu(IngGa)Se-2 well below its melting point is an essential prerequisite for the further optimization of the technologically relevant production processes. Therefore, powder XRD has been applied as nondestructive tool to follow chemical solide-state reactions in-situ. Subsequent Rietveld refinement provides the quantitative phase evolution time.

Authors with CRIS profile

Rainer Hock Professur für Kristallographie und Strukturphysik

How to cite

APA:

Hock, R. (2006). Real-time XRD investigations during the formation of Cu(IngGa)Se-2 Thin films. (pp. 423-426). WILEY-V C H VERLAG GMBH.

MLA:

Hock, Rainer. "Real-time XRD investigations during the formation of Cu(IngGa)Se-2 Thin films." WILEY-V C H VERLAG GMBH, 2006. 423-426.

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