Lehrstuhl für Elektronische Bauelemente

Scanning probe method investigation of carbon nanotubes produced by high energy ion irradiation of graphite (1999) Biró L, Márk G, Gyulai J, Rozlosnik N, Kürti J, Szabó B, Frey L, Ryssel H Journal article, Original article Impurity incorporation during beam assisted processing analyzed using nuclear microprobe (1999) Park Y, Takai M, Lehrer C, Frey L, Ryssel H Journal article, Original article Investigation of Cu films by focused ion beam induced deposition using nuclear microprobe (1999) Park Y, Takai M, Lehrer C, Frey L, Ryssel H Journal article, Original article Comparison of beam-induced deposition using ion microprobe (1999) Park Y, Nagai T, Takai M, Lehrer C, Frey L, Ryssel H Journal article, Review article Nano-slit probes for near-field optical microscopy fabricated by focused ion beams (1999) Danzebrink H, Dziomba T, Sulzbach T, Ohlsson O, Lehrer C, Frey L Journal article, Original article Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near-infrared scanning near-field optical microscopy (NIR-SNOM) (1999) Dziomba T, Sulzbach T, Ohlsson O, Lehrer C, Frey L, Danzebrink H Journal article, Original article Microprobe analysis of Pt films deposited by beam induced reaction (1998) Park Y, Takai M, Lehrer C, Frey L, Ryssel H Journal article, Original article Microanalysis of masklessly fabricated micro structures using nuclear microprobe (1998) Park Y, Takai M, Nagai T, Kishimoto T, Seidl A, Lehrer C, Frey L, Ryssel H Journal article, Original article Distortion of sims profiles due to ion beam mixing: Shallow arsenic implants in silicon (1998) Montandon C, Bourenkov A, Frey L, Pichler P, Biersack JP Journal article, Original article Synthesis of SiC by high temperature C+ implantation into SiO2: The role of Si/SiO2 interface (1997) Frey L, Stoemenos J, Schork R, Nejim A, Hemment P Journal article, Original article