Dr. Matthias Weißer


Publications (Download BibTeX)

Journal article
Brkljaca Z, Klimczak M, Milicevic Z, et al. (2015)
Complementary Molecular Dynamics and X-ray Reflectivity Study of an Imidazolium-Based Ionic Liquid at a Neutral Sapphire Interface
Journal of Physical Chemistry Letters

Journal article
Will J, Gröschel A, Bergmann C, et al. (2014)
Growth and nucleation regimes in boron doped silicon by dynamical x-ray diffraction
Applied Physics Letters

Journal article
Bergmann C, Will J, Gröschel A, et al. (2014)
Radial oxygen precipitation of a 12 '' CZ silicon crystal studied in-situ with high energy X-ray diffraction
Physica Status Solidi A-Applications and Materials Science

Journal article
Will J, Gröschel A, Weißer M, et al. (2011)
Thickness dependence of the integrated Bragg intensity for statistically disturbed silicon crystals
Applied Physics Letters

Conference contribution
Weißer M, Seitz C, Wellmann P, et al. (2004)
Structural defects in SiC crystals investigated by high energy x-ray diffraction
Materials Science Forum (Volumes 457-460)

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Last updated on 2017-05-25 at 02:00
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