Dr. Matthias Weißer


Lehrstuhl für Kristallographie und Strukturphysik

Publications (Download BibTeX)

Brkljaca, Z., Klimczak, M., Milicevic, Z., Weißer, M., Taccardi, N., Wasserscheid, P.,... Smith, A.-S. (2015). Complementary Molecular Dynamics and X-ray Reflectivity Study of an Imidazolium-Based Ionic Liquid at a Neutral Sapphire Interface. Journal of Physical Chemistry Letters, 6(3), 549--555. https://dx.doi.org/10.1021/jz5024493
Bergmann, C., Will, J., Gröschel, A., Weißer, M., & Magerl, A. (2014). Radial oxygen precipitation of a 12 '' CZ silicon crystal studied in-situ with high energy X-ray diffraction. Physica Status Solidi A-Applications and Materials Science, 211(11), 2450-2454. https://dx.doi.org/10.1002/pssa.201400062
Will, J., Gröschel, A., Bergmann, C., Weißer, M., & Magerl, A. (2014). Growth and nucleation regimes in boron doped silicon by dynamical x-ray diffraction. Applied Physics Letters, 105(11). https://dx.doi.org/10.1063/1.4896184
Will, J., Gröschel, A., Weißer, M., & Magerl, A. (2011). Thickness dependence of the integrated Bragg intensity for statistically disturbed silicon crystals. Applied Physics Letters, 98(4). https://dx.doi.org/10.1063/1.3531761
Weißer, M., Seitz, C., Wellmann, P., Hock, R., & Magerl, A. (2004). Structural defects in SiC crystals investigated by high energy x-ray diffraction. In Materials Science Forum (Volumes 457-460) (pp. 339-342). Lyon, FR: Switzerland: Trans Tech Publications.

Last updated on 2017-25-05 at 02:00