Eidgenössische Materialprüfungs- und Forschungsanstalt (Empa) / Swiss Federal Laboratories for Materials Science & Technology

Research facility


Location: Dübendorf, Switzerland (CH) CH

ISNI: 0000000123313059

ROR: https://ror.org/02x681a42

Show on Map:

close-button

Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

Erratum to "advanced thin film technology for ultrahigh resolution X-ray microscopy" [Ultramicroscopy 109 (2009) 1360-1364] (DOI:10.1016/j.ultramic.2009.07.005) (2010) Vila-Comamala J, Jefimovs K, Raabe J, Pilvi T, Fink R, Senoner M, Maassdorf A, et al. Journal article, Erratum NanoXAS - The in situ combination of scanning transmission X-ray and scanning probe microscopy (2010) Wenzel S, Fink R, Raabe J, Quitmann C, Hug HJ Conference contribution, Conference Contribution NanoXAS, a novel concept for high resolution microscopy (2009) Fink R, Raabe J, Quitmann C, Hug HJ Conference contribution, Conference Contribution A practical, self-catalytic, atomic layer deposition of silicon dioxide (2008) Bachmann J, Zierold R, Chong YT, Hauert R, Sturm C, Schmidt-Grund R, Rheinlaender B, et al. Journal article, Original article
‹ 1 ... 10 11 12 ›