NanoXAS, a novel concept for high resolution microscopy
Fink R, Raabe J, Quitmann C, Hug HJ (2009)
Publication Status: Accepted
Publication Type: Conference contribution, Conference Contribution
Publication year: 2009
Original Authors: I. Schmid, J. Raabe, C. Quitmann, S. Vranjkovic, H. J. Hug, R. H. Fink
Publisher: IOP Publishing
Conference Proceedings Title: Journal of Physics: Conference Series (JPCS) Volume 186/Band 1
Event location: Zürich, Switzerland
URI: http://iopscience.iop.org/1742-6596/186/1/012015
DOI: 10.1088/1742-6596/186/1/012015
Authors with CRIS profile
Involved external institutions
Paul Scherrer Institute (PSI)
Switzerland (CH)
Eidgenössische Materialprüfungs- und Forschungsanstalt (Empa) / Swiss Federal Laboratories for Materials Science & Technology
Switzerland (CH)
Switzerland (CH)
Eidgenössische Materialprüfungs- und Forschungsanstalt (Empa) / Swiss Federal Laboratories for Materials Science & Technology
Switzerland (CH)
How to cite
APA:
Fink, R., Raabe, J., Quitmann, C., & Hug, H.J. (2009). NanoXAS, a novel concept for high resolution microscopy. In Journal of Physics: Conference Series (JPCS) Volume 186/Band 1. Zürich, Switzerland, CH: IOP Publishing.
MLA:
Fink, Rainer, et al. "NanoXAS, a novel concept for high resolution microscopy." Proceedings of the 9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, Zürich, Switzerland IOP Publishing, 2009.
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