NanoXAS - The in situ combination of scanning transmission X-ray and scanning probe microscopy
Wenzel S, Fink R, Raabe J, Quitmann C, Hug HJ (2010)
Publication Type: Conference contribution, Conference Contribution
Publication year: 2010
Journal
Original Authors: Schmid I., Raabe J., Wenzel S., Fink R., Hug H., Quitmann C.
Publisher: American Institute of Physics
Book Volume: 1365
Pages Range: 449-452
Event location: Chicago, IL
DOI: 10.1063/1.3625399
Abstract
NanoXAS is a novel x-ray microscope installed at the Swiss Light Source combining laterally resolved soft x-ray spectroscopy with scanning probe microscopy. We report on first in situ studies from thin polymer blend films and magnetic materials where topographic and spectroscopic contrast are used and show how complementary imaging modes provide new insight into many materials. In the future the scanning probe tip will be used to collect photoelectrons. By this we expect a spatial resolution in the few-nm range and unique information on surface and bulk properties of nano-materials. © 2011 American Institute of Physics.
Authors with CRIS profile
Involved external institutions
Eidgenössische Materialprüfungs- und Forschungsanstalt (Empa) / Swiss Federal Laboratories for Materials Science & Technology
Switzerland (CH)
Paul Scherrer Institute (PSI)
Switzerland (CH)
Switzerland (CH)
Paul Scherrer Institute (PSI)
Switzerland (CH)
How to cite
APA:
Wenzel, S., Fink, R., Raabe, J., Quitmann, C., & Hug, H.J. (2010). NanoXAS - The in situ combination of scanning transmission X-ray and scanning probe microscopy. In Proceedings of the 10th International Conference on X-Ray Microscopy (pp. 449-452). Chicago, IL, US: American Institute of Physics.
MLA:
Wenzel, Stephan, et al. "NanoXAS - The in situ combination of scanning transmission X-ray and scanning probe microscopy." Proceedings of the 10th International Conference on X-Ray Microscopy, Chicago, IL American Institute of Physics, 2010. 449-452.
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