Department Elektrotechnik-Elektronik-Informationstechnik (EEI)

Phosphorus Ion Shower Implantation for special power IC applications (2000) Kröner F, Schork R, Frey L, Burenkov A, Ryssel H Conference contribution, Conference Contribution Investigation of molybdenum contamination in 11B+ and 31P+ implants (2000) Funk K, Häublein V, Chakor H, Ameen M, Frey L, Ryssel H, Ramirez A Conference contribution, Conference Contribution Gate oxide damage due to through the gate implantation in MOS-structures with ultrathin and standard oxides (2000) Jank M, Lemberger M, Frey L, Ryssel H Conference contribution, Conference Contribution Enhanced depth-resolution analysis with medium energy ion scattering (meis) for shallow junction profiling (2000) Tajima J, Park Y, Fujita M, Takai M, Schork R, Frey L, Ryssel H Conference contribution, Conference Contribution Defects and gallium - Contamination during focused ion beam micro machining (2000) Lehrer C, Frey L, Petersen S, Mizutam M, Takai M, Ryssel H Conference contribution, Conference Contribution MEMSTIC - Eine neue Schaltungstechnologie fuer den Submillimeter-Wellenlängenbereich (2000) Brand H, Weinzierl J Journal article, Review article Sensitive Simultaneous Detection of CO and CO$_2$ with Commercial DFB Diode Lasers for Optical Communication Systems (2000) Engelbrecht R, Brand H, Schmidt LP Conference contribution, Conference Contribution Greencard - Eine Loesung? (2000) Brand H Journal article, Report Quantization Watermarking (2000) Eggers J, Girod B Conference contribution Data-driven 3-D Rigid Body Motion and Structure Estimation (2000) Steinbach E Thesis