Biber S, Koca O, Huber K, Rehm G, Schmidt LP (2002)
Publication Language: English
Publication Type: Conference contribution
Publication year: 2002
Publisher: IEEE Computer Society
Edited Volumes: 2002 32nd European Microwave Conference, EuMC 2002
Conference Proceedings Title: Conference Proceedings of the European Microwave Week
Event location: Mailand
As Schottky diodes still remain the most frequently used devices in THz mixers, precise evaluation of their DC and noise performance is essential for the improvement of mixers in the sub-millimeter wave regime. We present first results from a measurement system which is able to measure the DC characteristics and the noise for Schottky diodes as a function of frequency and bias current. The automated system is capable of contacting many diodes consecutively. © 2002 IEEE.
APA:
Biber, S., Koca, O., Huber, K., Rehm, G., & Schmidt, L.-P. (2002). A Compact System for Systematic Noise Measurement of Schottky Diodes for THz Applications. In Conference Proceedings of the European Microwave Week. Mailand: IEEE Computer Society.
MLA:
Biber, Stephan, et al. "A Compact System for Systematic Noise Measurement of Schottky Diodes for THz Applications." Proceedings of the 2002 32nd European Microwave Conference, EuMC 2002, Mailand IEEE Computer Society, 2002.
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