Wafer container monitoring concerning airborne molecular contaminations along a 300 mm power semiconductor production flow (2021) Franze P, Schneider G, Kaskel S Conference contribution Analysis of EL emitted by LEDs on Si substrates containing GeSn/Ge multi quantum wells as active layers (2016) Schwartz B, Saring P, Arguirov T, Oehme M, Kostecki K, Kasper E, Schulze J, Kittler M Conference contribution Ge and GeSn light emitters on Si (2016) Oehme M, Gollhofer M, Kostecki K, Koerner R, Bechler S, Widmann D, Arguirov T, et al. Conference contribution Metastable defects in proton implanted and annealed silicon (2016) Jelinek M, Laven JG, Ganagona N, Job R, Schustereder W, Schulze HJ, Rommel M, Frey L Journal article Luminescence from germanium and germanium on silicon (2014) Arguirov T, Kittler M, Oehme M, Abrosimov NV, Vyvenko OF, Kasper E, Schulze J Conference contribution Room temperature direct band-gap emission from an unstrained Ge p-i-n LED on Si (2011) Arguirov T, Kittler M, Oehme M, Abrosimov NV, Kasper E, Schulze J Conference contribution Structural Defect Studies of Semiconductor Crystals with Laue Topography (2011) Gröschel A, Will J, Bergmann C, Grillenberger H, Eichler S, Scheffer-Czygan M, Magerl A Conference contribution, Conference Contribution In-Situ observation of the oxygen nucleation in silicon with X-Ray single crystal diffraction (2011) Will J, Gröschel A, Bergmann C, Magerl A Conference contribution Plastic anisotropy of ultrafine grained Al alloy AA6016 produced by accumulative roll bonding (2010) Skrotzki W, Scharnweber J, Oertel CG, Höppel HW, Topic I, Brokmeier HG, Jaschinski J Journal article Modeling of the Diffusion and Activation of Arsenic in Silicon Including Clustering and Precipitation (2008) Martinez Limia A, Pichler P, Steen C, Paul S, Lerch W Conference contribution