May A, Rommel M, Baier L, Schraml M, Dick J, Jank MP, Schulze J (2024)
Publication Type: Conference contribution
Publication year: 2024
Publisher: Institute of Electrical and Electronics Engineers Inc.
Conference Proceedings Title: 2024 Smart Systems Integration Conference and Exhibition, SSI 2024
ISBN: 9798350388770
DOI: 10.1109/SSI63222.2024.10740550
In order to provide an option for fabrication of high temperature sensing and circuit solutions, an accessible 4H-SiC high temperature CMOS technology was developed. A detailed overview of the fabrication process is given, with options for lateral power transistor integration, threshold voltage manipulation, optimization of interface state density, dedicated p-type ohmic contacts and two high temperature metallization layers. To prove high temperature device operation capability, device characteristics above 500 °C are presented. Examples include an inverter as a basic logic building block and a lateral power transistor with a blocking voltage of over 700 V. Finally, lateral integrated UV photodiodes based on a p-n junction are presented as a sensor application example. In collaboration with different partners, more complex integrated circuits and smart sensing solutions have also been realized and demonstrated previously, highlighting the possibilities if this technology.
APA:
May, A., Rommel, M., Baier, L., Schraml, M., Dick, J., Jank, M.P., & Schulze, J. (2024). A 4H-SiC CMOS Technology enabling Smart Sensor Integration and Circuit Operation above 500 °C. In 2024 Smart Systems Integration Conference and Exhibition, SSI 2024. Hamburg, DE: Institute of Electrical and Electronics Engineers Inc..
MLA:
May, Alexander, et al. "A 4H-SiC CMOS Technology enabling Smart Sensor Integration and Circuit Operation above 500 °C." Proceedings of the 2024 Smart Systems Integration Conference and Exhibition, SSI 2024, Hamburg Institute of Electrical and Electronics Engineers Inc., 2024.
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