Focused Soft X-Ray Beam Induced Deposition: Recent Advances to a Novel Approach for Fabrication of Metallic Nanostructures

Späth A, Vollnhals F, TU F, Prince KC, Richter R, Raabe J, Marbach H, Fink RH (2018)

Publication Type: Journal article, Original article

Publication year: 2018

Journal

Microscopy and Microanalysis Cambridge University Press (CUP)

Book Volume: 24

Pages Range: 116-117

Journal Issue: S2

DOI: 10.1017/S1431927618012965

Authors with CRIS profile

Andreas Späth Lehrstuhl für Physikalische Chemie II Florian Vollnhals Lehrstuhl für Physikalische Chemie II Fan TU Lehrstuhl für Physikalische Chemie II Hubertus Marbach Naturwissenschaftliche Fakultät

Involved external institutions

Elettra Sincrotrone Trieste S.C.p.A. IT Italy (IT) Paul Scherrer Institute (PSI) CH Switzerland (CH)

How to cite

APA:

Späth, A., Vollnhals, F., TU, F., Prince, K.C., Richter, R., Raabe, J.,... Fink, R.H. (2018). Focused Soft X-Ray Beam Induced Deposition: Recent Advances to a Novel Approach for Fabrication of Metallic Nanostructures. Microscopy and Microanalysis, 24(S2), 116-117. https://doi.org/10.1017/S1431927618012965

MLA:

Späth, Andreas, et al. "Focused Soft X-Ray Beam Induced Deposition: Recent Advances to a Novel Approach for Fabrication of Metallic Nanostructures." Microscopy and Microanalysis 24.S2 (2018): 116-117.

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