Challenges of Junction Temperature Calibration of SiC MOSFETs for Power Cycling - a Dynamic Approach

Breuer J, Dresel F, Leib J, März M, Schletz A (2024)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2024

Event location: Düsseldorf

Authors with CRIS profile

Martin März Lehrstuhl für Leistungselektronik

Involved external institutions

Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB) DE Germany (DE)

How to cite

APA:

Breuer, J., Dresel, F., Leib, J., März, M., & Schletz, A. (2024). Challenges of Junction Temperature Calibration of SiC MOSFETs for Power Cycling - a Dynamic Approach. In Proceedings of the 13th Int. Conference on Integrated Power Electronics Systems (CIPS). Düsseldorf.

MLA:

Breuer, Jakob, et al. "Challenges of Junction Temperature Calibration of SiC MOSFETs for Power Cycling - a Dynamic Approach." Proceedings of the 13th Int. Conference on Integrated Power Electronics Systems (CIPS), Düsseldorf 2024.

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