Milliseconds Power Cycling (PCmsec) driving bipolar degradation in Silicon Carbide Power Devices

Laha S, Leib J, Schletz A, März M, Liguda C, Faisal F, Momeni D (2024)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2024

Event location: Düsseldorf

Authors with CRIS profile

Martin März Lehrstuhl für Leistungselektronik

Involved external institutions

Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB) DE Germany (DE)

How to cite

APA:

Laha, S., Leib, J., Schletz, A., März, M., Liguda, C., Faisal, F., & Momeni, D. (2024). Milliseconds Power Cycling (PCmsec) driving bipolar degradation in Silicon Carbide Power Devices. In Proceedings of the 13th Int. Conference on Integrated Power Electronics Systems (CIPS). Düsseldorf.

MLA:

Laha, Sibasish, et al. "Milliseconds Power Cycling (PCmsec) driving bipolar degradation in Silicon Carbide Power Devices." Proceedings of the 13th Int. Conference on Integrated Power Electronics Systems (CIPS), Düsseldorf 2024.

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