Laboratory setup for extreme ultraviolet coherence tomography driven by a high-harmonic source

Nathanael J, Wuensche M, Fuchs S, Weber T, Abel JJ, Reinhard J, Wiesner F, Huebner U, Skruszewicz SJ, Paulus GG, Roedel C (2019)

Publication Type: Journal article

Publication year: 2019

Journal

Review of Scientific Instruments AIP Publishing

Book Volume: 90

Article Number: 113702

Journal Issue: 11

DOI: 10.1063/1.5102129

Abstract

We present a laboratory beamline dedicated to nanoscale subsurface imaging using extreme ultraviolet coherence tomography (XCT). In this setup, broad-bandwidth extreme ultraviolet (XUV) radiation is generated by a laser-driven high-harmonic source. The beamline is able to handle a spectral range of 30-130 eV and a beam divergence of 10 mrad (full width at half maximum). The XUV radiation is focused on the sample under investigation, and the broadband reflectivity is measured using an XUV spectrometer. For the given spectral window, the XCT beamline is particularly suited to investigate silicon-based nanostructured samples. Cross-sectional imaging of layered nanometer-scale samples can be routinely performed using the laboratory-scale XCT beamline. A depth resolution of 16 nm has been achieved using the spectral range of 36-98 eV which represents a 33% increase in resolution due to the broader spectral range compared to previous work.

Involved external institutions

Friedrich-Schiller-Universität Jena DE Germany (DE) Leibniz-Institut für Photonische Technologien e.V. DE Germany (DE)

How to cite

APA:

Nathanael, J., Wuensche, M., Fuchs, S., Weber, T., Abel, J.J., Reinhard, J.,... Roedel, C. (2019). Laboratory setup for extreme ultraviolet coherence tomography driven by a high-harmonic source. Review of Scientific Instruments, 90(11). https://dx.doi.org/10.1063/1.5102129

MLA:

Nathanael, Jan, et al. "Laboratory setup for extreme ultraviolet coherence tomography driven by a high-harmonic source." Review of Scientific Instruments 90.11 (2019).

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