Boettcher N, Takamori T, Wada K, Saito W, Nishizawa SI, Erlbacher T (2022)
Publication Type: Conference contribution
Publication year: 2022
Publisher: Institute of Electrical and Electronics Engineers Inc.
Book Volume: 2022-May
Pages Range: 261-264
Conference Proceedings Title: Proceedings of the International Symposium on Power Semiconductor Devices and ICs
Event location: Vancouver, BC, CAN
ISBN: 9781665422017
DOI: 10.1109/ISPSD49238.2022.9813628
This work presents the switching performance of a novel solid-state circuit breaker device suitable for DC-applications up to 800 V. These "dual thyristor"devices are manufactured employing a 4H-SiC JFET technology. With respect to scalability, the influence of specific design parameters on the quasi-static output characteristics are discussed along with corresponding fabrication aspects. In order to investigate the switching performance, clamped and unclamped inductive switching (CIS and UIS) experiments at up to 800 V are carried out. In case of CIS, current clearance is achieved within 642 ns after the self-sensed trigger event at 1.75 A. The UIS experiments reveal stable current handling capability during avalanche.
APA:
Boettcher, N., Takamori, T., Wada, K., Saito, W., Nishizawa, S.I., & Erlbacher, T. (2022). Fabrication Aspects and Switching Performance of a Self-Sensing 800 V SiC Circuit Breaker Device. In Proceedings of the International Symposium on Power Semiconductor Devices and ICs (pp. 261-264). Vancouver, BC, CAN: Institute of Electrical and Electronics Engineers Inc..
MLA:
Boettcher, Norman, et al. "Fabrication Aspects and Switching Performance of a Self-Sensing 800 V SiC Circuit Breaker Device." Proceedings of the 34th IEEE International Symposium on Power Semiconductor Devices and ICs, ISPSD 2022, Vancouver, BC, CAN Institute of Electrical and Electronics Engineers Inc., 2022. 261-264.
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