Fracture and electric‐field‐induced crack growth behavior in NBT‐6BT relaxor ferroelectrics

Shi X, Kumar N, Jones J, Hoffman M (2021)

Publication Type: Journal article

Publication year: 2021

Journal

Journal of the American Ceramic Society Wiley-Blackwell

Authors with CRIS profile

Xi Shi Lehrstuhl für Glas und Keramik

How to cite

APA:

Shi, X., Kumar, N., Jones, J., & Hoffman, M. (2021). Fracture and electric‐field‐induced crack growth behavior in NBT‐6BT relaxor ferroelectrics. Journal of the American Ceramic Society.

MLA:

Shi, Xi, et al. "Fracture and electric‐field‐induced crack growth behavior in NBT‐6BT relaxor ferroelectrics." Journal of the American Ceramic Society (2021).

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