Regulating the Surface Passivation and Residual Strain in Pure Tin Perovskite Films
Hu M, Nie R, Kim H, Wu J, Chen S, Park BW, Kim G, Kwon HW, Seok SI (2021)
Publication Type: Journal article
Publication year: 2021
Journal
Book Volume: 6
Pages Range: 3555-3562
Journal Issue: 10
DOI: 10.1021/acsenergylett.1c01575
Abstract
The passivation of electronic defects at the surfaces and grain boundaries of perovskite materials is one of the most important strategies for suppressing charge recombination in perovskite solar cells (PSCs). Although several passivation molecules have been investigated, few studies have focused on their application in regulating both the surface passivation and residual strain of perovskite films. In this study, the residual strain distribution profiles of the Cs0.1FA0.9SnI3 perovskite thin films and their effect on the photovoltaic device efficiencies were investigated. We found a gradient distribution of the out-of-plane compressive strain that correlated with the compositional inhomogeneity perpendicular to the substrate surface. By deliberately engineering dual effects of the surface passivation and residual strain, we achieved a record power conversion efficiency of up to 9.06%, the highest ever reported in a typical n-i-p architecture.
Authors with CRIS profile
Involved external institutions
Ulsan National Institute of Science and Technology (UNIST) / 울산과학기술원
Korea, Republic of (KR)
Chongqing University (CQU) / 重庆大学
China (CN)
Korea, Republic of (KR)
Chongqing University (CQU) / 重庆大学
China (CN)
How to cite
APA:
Hu, M., Nie, R., Kim, H., Wu, J., Chen, S., Park, B.-W.,... Seok, S.I. (2021). Regulating the Surface Passivation and Residual Strain in Pure Tin Perovskite Films. ACS Energy Letters, 6(10), 3555-3562. https://doi.org/10.1021/acsenergylett.1c01575
MLA:
Hu, Manman, et al. "Regulating the Surface Passivation and Residual Strain in Pure Tin Perovskite Films." ACS Energy Letters 6.10 (2021): 3555-3562.
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