Simultaneous SAXS/SANS Method at D22 of ILL: Instrument Upgrade

Metwalli E, Götz K, Zech T, Bär C, Schuldes I, Martel A, Porcar L, Unruh T (2021)

Publication Type: Journal article, Online publication

Publication year: 2021

Journal

Applied Sciences MDPI

Book Volume: 11

Article Number: 5925

Journal Issue: 13

URI: https://www.mdpi.com/2076-3417/11/13/5925

DOI: 10.3390/app11135925

Open Access Link: https://www.mdpi.com/2076-3417/11/13/5925

Abstract

A customized portable SAXS instrument has recently been constructed, installed, and tested at the D22 SANS instrument at ILL. Technical characteristics of this newly established plug-and-play SAXS system have recently been reported (J. Appl. Cryst. 2020, 53, 722). An optimized lead shielding arrangement on the SAXS system and a double energy threshold X-ray detector have been further implemented to substantially suppress the unavoidable high-energy gamma radiation background on the X-ray detector. The performance of the upgraded SAXS instrument has been examined systematically by determining background suppression factors (SFs) at various experimental conditions, including different neutron beam collimation lengths and X-ray sample-to-detector distances (SDDX-ray). Improved signal-to-noise ratio SAXS data enables combined SAXS and SANS measurements for all possible experimental conditions at the D22 instrument. Both SAXS and SANS data from the same sample volume can be fitted simultaneously using a common structural model, allowing unambiguous interpretation of the scattering data. Importantly, advanced in situ/real time investigations are possible, where both the SAXS and the SANS data can reveal time-resolved complementary nanoscale structural information.

Authors with CRIS profile

Klaus Götz Lehrstuhl für Kristallographie und Strukturphysik (ICSP) Tobias Zech Lehrstuhl für Kristallographie und Strukturphysik (ICSP) Christian Bär Professur für Nanomaterialcharakterisierung (Streumethoden) Isabel Schuldes Lehrstuhl für Kristallographie und Strukturphysik (ICSP) Tobias Unruh Professur für Nanomaterialcharakterisierung (Streumethoden)

Involved external institutions

Institute Laue-Langevin (ILL) FR France (FR)

How to cite

APA:

Metwalli, E., Götz, K., Zech, T., Bär, C., Schuldes, I., Martel, A.,... Unruh, T. (2021). Simultaneous SAXS/SANS Method at D22 of ILL: Instrument Upgrade. Applied Sciences, 11(13). https://doi.org/10.3390/app11135925

MLA:

Metwalli, Ezzeldin, et al. "Simultaneous SAXS/SANS Method at D22 of ILL: Instrument Upgrade." Applied Sciences 11.13 (2021).

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