Integrated Collinear Refractive Index Sensor with Ge PIN Photodiodes

Augel L, Kawaguchi Y, Bechler S, Koerner R, Schulze J, Uchida H, Fischer IA (2018)

Publication Type: Journal article

Publication year: 2018

Journal

ACS Photonics American Chemical Society

Book Volume: 5

Pages Range: 4586-4593

Journal Issue: 11

DOI: 10.1021/acsphotonics.8b01067

Abstract

Refractive index sensing is a highly sensitive and label-free detection method for molecular binding events. Commercial implementations of biosensing concepts based on plasmon resonances typically require significant external instrumentation such as microscopes and spectrometers. Few concepts exist that are based on direct integration of plasmonic nanostructures with optoelectronic devices for on-chip integration. Here, we present a CMOS-compatible refractive index sensor consisting of a Ge heterostructure PIN diode in combination with a plasmonic nanohole array structured directly into the diode Al contact metallization. In our devices, the photocurrent can be used to detect surface refractive index changes under simple top illumination and without the aid of signal amplification circuitry. Our devices exhibit large sensitivities >1000 nm per refractive index unit in bulk refractive index sensing and could serve as prototypes to leverage the cost-effectiveness of the CMOS platform for ultracompact, low-cost biosensors.

Authors with CRIS profile

Jörg Schulze

Involved external institutions

Universität Stuttgart DE Germany (DE) Toyohashi University of Technology (TUT) / 豊橋技術科学大学 JP Japan (JP)

How to cite

APA:

Augel, L., Kawaguchi, Y., Bechler, S., Koerner, R., Schulze, J., Uchida, H., & Fischer, I.A. (2018). Integrated Collinear Refractive Index Sensor with Ge PIN Photodiodes. ACS Photonics, 5(11), 4586-4593. https://doi.org/10.1021/acsphotonics.8b01067

MLA:

Augel, Lion, et al. "Integrated Collinear Refractive Index Sensor with Ge PIN Photodiodes." ACS Photonics 5.11 (2018): 4586-4593.

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