Kohlhepp B, Kübrich D, Dürbaum T, Tannhaeuser M, Hoffmann A (2019)
Publication Type: Conference contribution
Publication year: 2019
Publisher: IEEE
City/Town: NEW YORK
Conference Proceedings Title: 2019 IEEE ELECTRICAL POWER AND ENERGY CONFERENCE (EPEC)
DOI: 10.1109/epec47565.2019.9074792
APA:
Kohlhepp, B., Kübrich, D., Dürbaum, T., Tannhaeuser, M., & Hoffmann, A. (2019). Measuring of Dynamic On-State Resistance of GaN-HEMTs in Half-Bridge Application under Hard and Soft Switching Operation. In 2019 IEEE ELECTRICAL POWER AND ENERGY CONFERENCE (EPEC). Montreal, CA: NEW YORK: IEEE.
MLA:
Kohlhepp, Benedikt, et al. "Measuring of Dynamic On-State Resistance of GaN-HEMTs in Half-Bridge Application under Hard and Soft Switching Operation." Proceedings of the IEEE Electrical Power and Energy Conference (EPEC), Montreal NEW YORK: IEEE, 2019.
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