Measuring of Dynamic On-State Resistance of GaN-HEMTs in Half-Bridge Application under Hard and Soft Switching Operation - Kohlhepp, Benedikt; Kübrich, Daniel; Dürbaum, Thomas; Tannhaeuser, Marvin; Hoffmann, Andreas (2019 IEEE ELECTRICAL POWER AND ENERGY CONFERENCE (EPEC), 2019)
CRIS-Team WoS Importer:2020-10-02