Teich J, Fummi F (2019)
Publication Type: Journal article
Publication year: 2019
Book Volume: 36
Pages Range: 59-61
Journal Issue: 4
DOI: 10.1109/MDAT.2019.2915112
APA:
Teich, J., & Fummi, F. (2019). Conference Reports: Recap of DATE 2019 in Florence, Italy. IEEE Design & Test, 36(4), 59-61. https://doi.org/10.1109/MDAT.2019.2915112
MLA:
Teich, Jürgen, and Franco Fummi. "Conference Reports: Recap of DATE 2019 in Florence, Italy." IEEE Design & Test 36.4 (2019): 59-61.
BibTeX: Download