IEEE Design & Test
ISSN: 2168-2356
Publisher: IEEE
Publications (4)
Special Issue on Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems (2023)
Bosio A, Barbareschi M, Savino A, Han J, Teich J
Journal article
Conference Reports: Recap of DATE 2019 in Florence, Italy (2019)
Teich J, Fummi F
Journal article
Advances in Forensic Data Acquisition (2018)
Freiling F, Groß T, Latzo T, Müller T, Palutke R
Journal article, Original article
Scalable One-Pass Synthesis for Digital Microfluidic Biochips (2015)
Wille R, Keszocze O, Drechsler R, Boehnisch T, Kroker A
Journal article, Original article