Discriminating bulk versus interface shunts in organic solar cells by advanced imaging techniques
Karl A, Osvet A, Vetter A, Maisch P, Li N, Egelhaaf HJ, Brabec C (2019)
Publication Language: English
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 2019
Journal
Publisher: John Wiley and Sons Ltd
Pages Range: 1-9
DOI: 10.1002/pip.3121
Abstract
An important aspect when upscaling organic photovoltaics from laboratory to industrial scale is quality control. Established imaging techniques like lock‐in thermography or luminescence imaging are frequently used for this purpose. While these techniques allow for the lateral detection of defects, they cannot provide information on the vertical position of the defect in the OPV stack. Here, we present an approach to overcome this limitation. A femtosecond‐laser is deployed to introduce well‐defined artificial calibration defects selectively into both the interface and the bulk active layer of inverted P3HT:PCBM bulk heterojunction cells during device fabrication. The defective cells are then characterized using J‐V analysis and several nondestructive imaging methods (dark lock‐in thermography, photoluminescence, and electroluminescence imaging). The distinct response for each defect in the different imaging methods enables us to uniquely distinguish between bulk and interface defects. This allows to study surface recombination under most controlled conditions.
Authors with CRIS profile
André Karl
Institute Materials for Electronics and Energy Technology (i-MEET)
Andres Osvet
Institute Materials for Electronics and Energy Technology (i-MEET)
Andreas Vetter
Institute Materials for Electronics and Energy Technology (i-MEET)
Philipp Maisch
Institute Materials for Electronics and Energy Technology (i-MEET)
Ning Li
Institute Materials for Electronics and Energy Technology (i-MEET)
Christoph Brabec
Institute Materials for Electronics and Energy Technology (i-MEET)
Involved external institutions
Germany (DE)How to cite
APA:
Karl, A., Osvet, A., Vetter, A., Maisch, P., Li, N., Egelhaaf, H.J., & Brabec, C. (2019). Discriminating bulk versus interface shunts in organic solar cells by advanced imaging techniques. Progress in Photovoltaics, 1-9. https://doi.org/10.1002/pip.3121
MLA:
Karl, André, et al. "Discriminating bulk versus interface shunts in organic solar cells by advanced imaging techniques." Progress in Photovoltaics (2019): 1-9.
BibTeX: Download