Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography

Lu CD, Lee B, Schottenhamml J, Maier A, Pugh EN, Fujimoto JG (2017)

Publication Type: Journal article

Publication year: 2017

Journal

Investigative Ophthalmology & Visual Science Association for Research in Vision and Ophthalmology (ARVO)

Publisher: Association for Research in Vision and Ophthalmology Inc.

Book Volume: 58

Pages Range: 4632-4643

Journal Issue: 11

DOI: 10.1167/iovs.17-22171

Authors with CRIS profile

Julia Schottenhamml Lehrstuhl für Informatik 5 (Mustererkennung) Andreas Maier Lehrstuhl für Informatik 5 (Mustererkennung)

Involved external institutions

Massachusetts Institute of Technology (MIT) US United States (USA) (US) University of California Davis (UCDAVIS) US United States (USA) (US)

How to cite

APA:

Lu, C.D., Lee, B., Schottenhamml, J., Maier, A., Pugh, E.N., & Fujimoto, J.G. (2017). Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography. Investigative Ophthalmology & Visual Science, 58(11), 4632-4643. https://doi.org/10.1167/iovs.17-22171

MLA:

Lu, Chen D., et al. "Photoreceptor Layer Thickness Changes During Dark Adaptation Observed With Ultrahigh-Resolution Optical Coherence Tomography." Investigative Ophthalmology & Visual Science 58.11 (2017): 4632-4643.

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