Resolving in situ specific-contact, current-crowding, and channel resistivity in nanowire devices: A case study with silver nanowires

Krstic V, Kolesnik MM, Hansel S, Lutz T, Kinahan N, Boese M, Krstic V (2011)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2011

Journal

Small Wiley-VCH Verlag

Book Volume: 7

Pages Range: 2873-2877

Journal Issue: 20

DOI: 10.1002/smll.201100600

Authors with CRIS profile

Vojislav Krstic Professur für Angewandte Physik

Involved external institutions

Trinity College Dublin IE Ireland (IE)

How to cite

APA:

Krstic, V., Kolesnik, M.M., Hansel, S., Lutz, T., Kinahan, N., Boese, M., & Krstic, V. (2011). Resolving in situ specific-contact, current-crowding, and channel resistivity in nanowire devices: A case study with silver nanowires. Small, 7(20), 2873-2877. https://doi.org/10.1002/smll.201100600

MLA:

Krstic, Vojislav, et al. "Resolving in situ specific-contact, current-crowding, and channel resistivity in nanowire devices: A case study with silver nanowires." Small 7.20 (2011): 2873-2877.

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