Reliability of monolithic RC-snubbers in MOS-based power modules

Erlbacher T, Schwarzmann H, Krach F, Bauer AJ, Berberich SE, Kasko I, Frey L (2014)

Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2014

Publisher: Institute of Electrical and Electronics Engineers Inc.

Article Number: 6962794

ISBN: 9781479940264

DOI: 10.1109/ESTC.2014.6962794

Authors with CRIS profile

Florian Krach Lehrstuhl für Elektronische Bauelemente Lothar Frey Lehrstuhl für Elektronische Bauelemente

Involved external institutions

Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB) DE Germany (DE) SEMIKRON Elektronik GmbH & Co. KG DE Germany (DE)

How to cite

APA:

Erlbacher, T., Schwarzmann, H., Krach, F., Bauer, A.J., Berberich, S.E., Kasko, I., & Frey, L. (2014). Reliability of monolithic RC-snubbers in MOS-based power modules. In Proceedings of the 5th Electronics System-Integration Technology Conference, ESTC 2014. Institute of Electrical and Electronics Engineers Inc..

MLA:

Erlbacher, T., et al. "Reliability of monolithic RC-snubbers in MOS-based power modules." Proceedings of the 5th Electronics System-Integration Technology Conference, ESTC 2014 Institute of Electrical and Electronics Engineers Inc., 2014.

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