Wellmann P, Müller R, Sakwe A, Künecke U, Hens P, Stockmeier M, Konias K, Hock R, Magerl A, Pons M (2008)
Publication Language: English
Publication Status: Published
Publication Type: Journal article, Original article
Publication year: 2008
Publisher: Materials Research Society
Book Volume: 1069
Pages Range: 3-14
Conference Proceedings Title: MRS Proceedings / Volume 1069 / 2008
Event location: San Francisco, California
The paper reviews the basics of SiC bulk growth by the physical vapor transport (PVT) method and discusses current and possible future concepts to improve crystalline quality. In-situ process visualization using x-rays, numerical modeling and advanced doping techniques will be briefly presented which support growth process optimization. The ,,pure" PVT technique will be compared with related developments like the so called Modified-PVT, Continuous-Feeding-PVT, High-Temperature-CVD and Halide-CVD. Special emphasis will be put on dislocation generation and annihilation and concepts to reduce dislocation density during SiC bulk crystal growth. The dislocation study is based on a statistical approach. Rather than following the evolution of a single defect, statistic data which reflect a more global dislocation density evolution are interpreted. In this context a new approach will be presented which relates thermally induced strain during growth and dislocation patterning into networks.
APA:
Wellmann, P., Müller, R., Sakwe, A., Künecke, U., Hens, P., Stockmeier, M.,... Pons, M. (2008). Bulk growth of SiC. Materials Research Society Symposium - Proceedings, 1069, 3-14. https://doi.org/10.1557/PROC-1069-D01-01
MLA:
Wellmann, Peter, et al. "Bulk growth of SiC." Materials Research Society Symposium - Proceedings 1069 (2008): 3-14.
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