A measurement method to mitigate temperature effects in nanometer CMOS RF power amplifiers

Oßmann P, Fuhrmann J, Moreira J, Pretl H, Springer A (2014)

Publication Type: Conference contribution, Conference Contribution

Publication year: 2014

DOI: 10.1109/Austrochip.2014.6946320

Authors with CRIS profile

Jörg Fuhrmann Lehrstuhl für Technische Elektronik

Involved external institutions

Johannes Kepler Universität (JKU) Linz AT Austria (AT)

How to cite

APA:

Oßmann, P., Fuhrmann, J., Moreira, J., Pretl, H., & Springer, A. (2014). A measurement method to mitigate temperature effects in nanometer CMOS RF power amplifiers. In Proceedings of the Microelectronics (Austrochip), 22nd Austrian Workshop on.

MLA:

Oßmann, Patrick, et al. "A measurement method to mitigate temperature effects in nanometer CMOS RF power amplifiers." Proceedings of the Microelectronics (Austrochip), 22nd Austrian Workshop on 2014.

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