GROWTH AND STRUCTURE OF THIN CO FILMS ON CU(111) STUDIED BY FULL-SOLID-ANGLE X-RAY PHOTOELECTRON DISTRIBUTIONS

Fauster T (1993)


Publication Status: Published

Publication Type: Journal article

Publication year: 1993

Journal

Publisher: American Physical Society

Book Volume: 48

Pages Range: 11361-11366

DOI: 10.1103/PhysRevB.48.11361

Abstract

Photoelectron spectroscopy at kinetic energies of almost-equal-to 570 eV has been performed on a Cu(111) surface with Co coverages of up to 50 monolayers. The angle-integrated data indicate that tall islands develop with Cu atoms in the top layers. The angular distributions of the photoelectrons were measured using a display-type analyzer with an opening angle of 88-degrees. The Co emission patterns always show some threefold symmetry corresponding to the fcc structure of the clean Cu(111) surface. Most of the Co atoms are in the hcp structure and this fraction increases with coverage.

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How to cite

APA:

Fauster, T. (1993). GROWTH AND STRUCTURE OF THIN CO FILMS ON CU(111) STUDIED BY FULL-SOLID-ANGLE X-RAY PHOTOELECTRON DISTRIBUTIONS. Physical Review B, 48, 11361-11366. https://doi.org/10.1103/PhysRevB.48.11361

MLA:

Fauster, Thomas. "GROWTH AND STRUCTURE OF THIN CO FILMS ON CU(111) STUDIED BY FULL-SOLID-ANGLE X-RAY PHOTOELECTRON DISTRIBUTIONS." Physical Review B 48 (1993): 11361-11366.

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