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Surface sensitivity in scanning transmission x-ray microspectroscopy using secondary electron detection

Hub C, Wenzel S, Raabe J, Ade H, Fink R (2010)

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Publication Type: Journal article, Original article

Publication year: 2010

Journal

Original Authors: Hub C., Wenzel S., Raabe J., Ade H., Fink R.H.

Publisher: American Institute of Physics (AIP)

Book Volume: 81

Article Number: 033704

Journal Issue: 3

DOI: 10.1063/1.3360813

Abstract

The successful integration of electron detection into an existing scanning transmission x-ray microspectroscope (STXM) at the Swiss Light Source is demonstrated. In conventional x-ray detection using a photomultiplier, STXM offers mainly bulk sensitivity combined with high lateral resolution. However, by implementation of a channeltron electron multiplier, the surface sensitivity can be established by the detection of secondary electrons emitted from the sample upon resonant excitation. We describe the experimental setup and discuss several relevant aspects, in particular the schemes to correct for self-absorption in the specimen due to back illumination in case of thicker films. © 2010 American Institute of Physics.

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How to cite

APA:

Hub, C., Wenzel, S., Raabe, J., Ade, H., & Fink, R. (2010). Surface sensitivity in scanning transmission x-ray microspectroscopy using secondary electron detection. Review of Scientific Instruments, 81(3). https://doi.org/10.1063/1.3360813

MLA:

Hub, Christian, et al. "Surface sensitivity in scanning transmission x-ray microspectroscopy using secondary electron detection." Review of Scientific Instruments 81.3 (2010).

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