Temperature and electrical field dependence of the ambipolar mobility in n-doped 4H-SiC

Hürner A, Bonse C, Clemmer G, Kallinger B, Heckel T, Erlbacher T, Mitlehner H, Häublein V, Bauer A, Frey L, Heckel T (2014)


Publication Status: Published

Publication Type: Authored book, Volume of book series

Publication year: 2014

Publisher: Trans Tech Publications Ltd

Pages Range: 487-490

Event location: Miyazaki

ISBN: 9783038350101

DOI: 10.4028/www.scientific.net/MSF.778-780.487

Abstract

In this study, we present results on electrical characterization of bipolar pn-diodes to investigate the temperature and electrical field dependent behavior of ambipolar mobility in n-doped 4H-SiC. Therefore, static current-voltage measurements to calculate the specific differential resistance and dynamical reverse recovery measurements to determine the mean carrier concentration were carried out for different temperatures and forward current densities. The specific differential resistance of the drift layer decreased from 10 mWcm at 80 Acm to 6.6 mWcm at 180 Acm, whereas the mean carrier concentration only increased from 4.10 cm to 8.10 cm, indicating a decreasing ambipolar mobility. The calculated reduction of the ambipolar mobility from 800 cmVs to 650 cmVs in dependence on the current density has to be attributed to an increasing electric field from 150 Vcm to 250 Vcm and increasing carrier scattering due to higher carrier concentrations. For example, at a constant conduction current density of 160 Acm, the ambipolar mobility decreases from 710 cmVs at 300 K to 650 cmVs at 450 K. © (2014) Trans Tech Publications, Switzerland.

Authors with CRIS profile

Related research project(s)

Involved external institutions

How to cite

APA:

Hürner, A., Bonse, C., Clemmer, G., Kallinger, B., Heckel, T., Erlbacher, T.,... Heckel, T. (2014). Temperature and electrical field dependence of the ambipolar mobility in n-doped 4H-SiC. Trans Tech Publications Ltd.

MLA:

Hürner, Andreas, et al. Temperature and electrical field dependence of the ambipolar mobility in n-doped 4H-SiC. Trans Tech Publications Ltd, 2014.

BibTeX: Download