[01-15] grown 6H SiC bulk crystals investigated by high energy triple axis x-ray diffraction

Hock R (2005)

Publication Status: Published

Publication Type: Conference contribution

Publication year: 2005

Journal

Materials Science Forum Trans Tech Publications

Book Volume: 483

Pages Range: 307-310

Abstract

A structural characterisation of the first [01-15] grown 6H SiC crystals is presented. They show a different micro domain structure outside the facetted region as compared to conventionally [0001] grown crystals. It is imposed by the reduced rotational symmetry for this direction which favours the activation of a low number of glide systems.

Authors with CRIS profile

Rainer Hock Professur für Kristallographie und Strukturphysik

How to cite

APA:

Hock, R. (2005). [01-15] grown 6H SiC bulk crystals investigated by high energy triple axis x-ray diffraction. (pp. 307-310).

MLA:

Hock, Rainer. "[01-15] grown 6H SiC bulk crystals investigated by high energy triple axis x-ray diffraction." 2005. 307-310.

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