Advantages of aberration correction for HRTEM investigation of complex layer compounds

Spiecker E, Garbrecht M, Jaeger W, Tillmann K (2010)

Publication Status: Published

Publication Type: Conference contribution

Publication year: 2010

Journal

Journal of Microscopy Wiley-Blackwell

Publisher: Wiley-Blackwell

Book Volume: 237

Pages Range: 341-346

Journal Issue: 3

DOI: 10.1111/j.1365-2818.2009.03257.x

Abstract

Aberration-corrected high-resolution transmission electron microscopy (HRTEM) has been applied to resolve the atomic structure of a complex layered crystal, (PbS)(1.14)NbS(2), which comprises a high density of incommensurate interfaces. The strong suppression of image delocalization and the favourable contrast transfer under negative C(s) imaging (NCSI) conditions have been exploited for obtaining HRTEM images which directly reveal the projected crystal structure and allow to study lattice imperfections, like stacking disorder and layer undulations, with atomic scale resolution. The advantages of aberration-corrected HRTEM over conventional HRTEM are demonstrated by direct comparison of experimental images and computer simulations.

Authors with CRIS profile

Erdmann Spiecker Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

Additional Organisation(s)

Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)

Involved external institutions

Christian-Albrechts-Universität zu Kiel DE Germany (DE) Forschungszentrum Jülich / Research Centre Jülich (FZJ) DE Germany (DE)

How to cite

APA:

Spiecker, E., Garbrecht, M., Jaeger, W., & Tillmann, K. (2010). Advantages of aberration correction for HRTEM investigation of complex layer compounds. (pp. 341-346). Wiley-Blackwell.

MLA:

Spiecker, Erdmann, et al. "Advantages of aberration correction for HRTEM investigation of complex layer compounds." Wiley-Blackwell, 2010. 341-346.

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