Journal of Microscopy

Journal Abbreviation: J MICROSC-OXFORD
ISSN: 0022-2720
eISSN: 1365-2818
Publisher: Wiley-Blackwell

Publications (13)


Types of publications

Journal article
Unpublished / Preprint

Publication year



A Python tool to determine the thickness of the hydrate layer around clinker grains using SEM-BSE images (2024) Kleiner F, Becker F, Rößler C, Ludwig HM Journal article Calibration by differentiation – Self-supervised calibration for X-ray microscopy using a differentiable cone-beam reconstruction operator (2022) Thies M, Wagner F, Huang Y, Gu M, Kling L, Pechmann S, Aust O, et al. Journal article, Original article Application of sensitive, high-resolution imaging at a commercial lab-based X-ray micro-CT system using propagation-based phase retrieval (2017) Bidola P, Morgan K, Willner M, Fehringer A, Allner S, Prade F, Pfeiffer F, Achterhold K Journal article Automatic quantification of angiogenesis in 2D sections: a precise and timesaving approach (2015) Weis C, Covi JM, Hilgert J, Leibig N, Arkudas A, Horch RE, Kneser U, Schmidt VJ Journal article Review of free software tools for image analysis of fluorescence cell micrographs (2015) Wiesmann V, Franz D, Held C, Münzenmayer C, Palmisano R, Wittenberg T Journal article, Original article Three-dimensional imaging of whole mouse models: Comparing nondestructive X-ray phase-contrast micro-CT with cryotome-based planar epi-illumination imaging (2014) Tapfer A, Bech M, Zanette I, Symvoulidis P, Stangl S, Multhoff G, Molls M, et al. Journal article Influence of the phase effect on gradient-based and statistics-based focus measures in bright field microscopy (2014) Schöll S, Mualla F, Sommerfeldt B, Steidl S, Maier A, Buchholz R, Hornegger J Journal article 3D structural analysis: sensitivity of Minkowski functionals (2010) Arns CH, Knackstedt MA, Mecke K Journal article Tensorial Minkowski functionals and anisotropy measures for planar patterns (2010) Schröder-Turk G, Kapfer S, Breidenbach B, Beisbart C, Mecke K Journal article Advantages of aberration correction for HRTEM investigation of complex layer compounds (2010) Spiecker E, Garbrecht M, Jaeger W, Tillmann K Conference contribution