Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation

Roll G, Jakschik S, Burenkov A, Goldbach M, Mikolajick T, Frey L (2011)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2011

Journal

Solid-State Electronics Elsevier

Pages Range: 170-176

Journal Issue: 1

DOI: 10.1016/j.sse.2011.06.016

Authors with CRIS profile

Lothar Frey Lehrstuhl für Elektronische Bauelemente

Involved external institutions

NaMLab gGmbH DE Germany (DE) Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB) DE Germany (DE) Qimonda AG DE Germany (DE)

How to cite

APA:

Roll, G., Jakschik, S., Burenkov, A., Goldbach, M., Mikolajick, T., & Frey, L. (2011). Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation. Solid-State Electronics, 1, 170-176. https://doi.org/10.1016/j.sse.2011.06.016

MLA:

Roll, Guntrade, et al. "Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation." Solid-State Electronics 1 (2011): 170-176.

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