Center for Nanoanalysis and Electron Microscopy (CENEM)
FAU own research funding: EFI / IZKF / EAM ...
Acronym:
CENEM
Start date :
01.01.2010
End date :
03.03.2038
Project details
Scientific Abstract
The Center for Nanoanalysis and
Electron Microscopy (CENEM) is a facility featuring cutting-edge
instrumentation, techniques and expertise required for microscopic and
analytical characterization of materials and devices down to the atomic
scale. CENEM focuses on several complementary analysis techniques, which
closely work together: Electron Microscopy, X-ray Microscopy, Cryo-TEM,
Scattering Methods, Scanning Probes and Atom Probe Microscopy. With the
combination of these methods new materials, particles, structures and
devices are characterized not only microscopically and analytically on
all length scales even down to the atomic scale but also by various in
situ investigations and 3D methods. The knowledge gained through the
versatile characterization methods is then used to further develop and
improve materials and devices.
CENEM was established in 2010 to
provide a forefront research center for the versatile characterization
of materials and devices with state-of-the-art instrumentation and
expertise and to intensify the interdisciplinary research. The big CENEM
network represents the strong collaborations within the University of
Erlangen-Nürnberg as well as the collaboration with other universities,
dedicated research institutes and industry.
The support of the core facility CENEM by the German Science
Foundation (DFG) and the Cluster of Excellence EXC 315 “Engineering of
Advanced Materials” is gratefully acknowledged.
Involved:
Contributing FAU Organisations:
Research Areas