Birk Fritsch

Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung) Lehrstuhl für Elektronische Bauelemente Lehrstuhl für Leistungselektronik

Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy (Scientific Reports, (2020), 10, 1, (13676), 10.1038/s41598-020-70580-3) (2023) Hutzler A, Fritsch B, Matthus CD, Jank MP, Rommel M Journal article, Erratum Goethite Mineral Dissolution to Probe the Chemistry of Radiolytic Water in Liquid-Phase Transmission Electron Microscopy (2023) Couasnon T, Fritsch B, Jank MP, Blukis R, Hutzler A, Benning LG Journal article Radiolysis‐Driven Evolution of Gold Nanostructures – Model Verification by Scale Bridging In Situ Liquid‐Phase Transmission Electron Microscopy and X‐Ray Diffraction (2022) Fritsch B, Zech T, Bruns M, Körner A, Khadivianazar S, Wu M, Zargar Talebi N, et al. Journal article Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells (2022) Fritsch B, Wu M, Hutzler A, Zhou D, Spruit R, Vogl L, Will J, et al. Journal article Modelling the Radiolysis of Silver Nitrate Solutions in presence of Bromide Ions in Liquid-Phase Transmission Electron Microscopy (2021) Taherkhani M, Fritsch B, Jank MPM, Spiecker E, Hutzler A Journal article, Original article Beam-induced heating at low electron fluxes during liquid phase transmission electron microscopy (2021) Fritsch B, Hutzler A, Wu M, Vogl L, Jank MP, März M, Spiecker E Journal article, Original article Evaluating local temperature changes during liquid cell transmission electron microscopy by in situ parallel beam electron diffraction (2021) Fritsch B, Hutzler A, Wu M, Vogl L, Jank MPM, März M, Spiecker E Conference contribution, Abstract of lecture Direct Manipulation of Nanostructures Utilizing Donut-Shaped Potential Wells during Liquid-Phase Transmission Electron Microscopy (2021) Hutzler A, Fritsch B, Branscheid R, Wu M, Jank M, Spiecker E Conference contribution Accessing local electron-beam induced temperature changes during in situ liquid-phase transmission electron microscopy (2021) Fritsch B, Hutzler A, Wu M, Khadivianazar S, Vogl L, Jank MPM, März M, Spiecker E Journal article, Letter Highly Accurate Determination of Heterogeneously Stacked Van-der-Waals Materials by Optical Microspectroscopy (2020) Hutzler A, Fritsch B, Matthus C, Jank MPM, Rommel M Journal article, Original article