Dr.-Ing. Jan Steffen Schür



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Types of publications

Journal article
Book chapter / Article in edited volumes
Authored book
Translation
Thesis
Edited Volume
Conference contribution
Other publication type
Unpublished / Preprint

Publication year

From
To

Abstract

Journal

An Ultra-Wideband DC-Block on Thin-Film Ceramic for the Next Generation of Test and Measurement Applications Up to 150 GHz (2023) Scheder A, Pfahler T, Bridier A, Schür J, Vossiek M Conference contribution Deep learning for terahertz image denoising in nondestructive historical document analysis (2022) Dutta B, Root K, Ullmann I, Wagner F, Mayr M, Seuret M, Thies M, et al. Journal article, Original article Kontaktlose, bildgebende Untersuchung historischer Dokumente im Terahertz-Frequenzbereich (2022) Ullmann I, Schür J, Root K, Vossiek M Conference contribution, Conference Contribution 3D Printed Waveguide Transition for 77 GHz Radar Applications (2022) Engel L, Lomakin K, Gold G, Pfahler T, Schür J, Vossiek M Conference contribution, Conference Contribution Contactless Inspection of Handwritten Documents with Terahertz Imaging (2022) Ullmann I, Root K, Schür J, Scheuble L, Vossiek M Conference contribution, Conference Contribution Design Optimization of Pyramidal Horn Antennas for 3D Printing in the mm-Wave Range (2022) Lomakin K, Schür J, Gold G Conference contribution, Conference Contribution Ultra-Wideband Complex Permittivity Extraction of IC Packaging Materials beyond 100 GHz (2021) Pfahler T, Gold G, Lomakin K, Engel L, Schür J, Vossiek M Conference contribution, Original article Merkblatt MTHz 01 - Mikrowellenprüfung: Grundlagen und Anwendungen (2021) Becker S, Hinken JH, Schür J Conference contribution, Conference Contribution Innovative drahtlose Sensorkonzepte für das in-situ Monitoring von Aushärtevorgängen in Epoxidharzsystemen und Faserverbundbauteilen (2021) Dorbath B, Groh J, Schür J, Vossiek M Conference contribution, other Automated Defect Detection for Non-Destructive Evaluation by Radar Imaging and Machine Learning (2020) Ullmann I, Egerer P, Schür J, Vossiek M Conference contribution, Conference Contribution